POLISH ACADEMY of SCIENCES
TECHNICAL SCIENCES
Advanced materials and technologies
| BULLETIN
of the
POLISH ACADEMY of SCIENCES TECHNICAL SCIENCES |
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| Volume
58, Issue 2, June 2010
Advanced materials and technologies |
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| Issue Index | Authors Index | Scope Index | Web Info | |
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| Aims&Scope, Subscription | Editors | Authors' guide | to read PDF files | mirror: http://fluid.ippt.gov.pl/~bulletin/ |
| pp 237 - 253 |
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Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy |
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| W. NEUMANN , H. KIRMSE, I. HAUSLER, A. MOGILATENKO, CH. ZHENG, and W. HETABA |
| Transmission electron microscopy (TEM) is a powerful diagnostic tool for the determination of structure/property relationships of materials. A comprehensive analysis of materials requires a combined use of a variety of complementary electron microscopical techniques of imaging, diffraction and spectroscopy at an atomic level of magnitude. The possibilities and limitations of quantitative TEM analysis will be demonstrated for interface studies of the following materials and materials systems: Nickel-based superalloy CMSX-10, (Zn,Cd)O/ZnO/Al2O3, (Al,Ga)N/AlN/Al2O3 , GaN/LiAlO2 and FeCo-based nanocrystalline alloys. |
| Key words: |
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electron microscopy, energy dispersive X-ray spectroscopy, electron energy-loss spectroscopy, electron holography, Lorentz microscopy, interface analysis |
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| Issue Index | Authors Index | Scope Index | Web Info |
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| Aims&Scope, Subscription | Editors | Authors' guide | to read PDF files |
| Copyright ® Bulletin of the Polish Academy of Sciences: Technical Sciences |
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