BULLETIN of the

POLISH ACADEMY of SCIENCES

TECHNICAL SCIENCES

BULLETIN of the POLISH ACADEMY of SCIENCES: TECHNICAL SCIENCES
Volume 58, Issue 2, June 2010

Advanced materials and technologies

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pp 237 - 253

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Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy

W. NEUMANN , H. KIRMSE, I. HAUSLER, A. MOGILATENKO, CH. ZHENG, and W. HETABA
Transmission electron microscopy (TEM) is a powerful diagnostic tool for the determination of structure/property relationships of materials. A comprehensive analysis of materials requires a combined use of a variety of complementary electron microscopical techniques of imaging, diffraction and spectroscopy at an atomic level of magnitude. The possibilities and limitations of quantitative TEM analysis will be demonstrated for interface studies of the following materials and materials systems: Nickel-based superalloy CMSX-10, (Zn,Cd)O/ZnO/Al2O3, (Al,Ga)N/AlN/Al2O3 , GaN/LiAlO2 and FeCo-based nanocrystalline alloys.
Key words:

electron microscopy, energy dispersive X-ray spectroscopy, electron energy-loss spectroscopy, electron holography, Lorentz microscopy, interface analysis


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